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Development of an infrared absorption measurement method using the photothermal deflection effect of thallium bromide iodide (KRS-5): Measurement with a stepped-scan Fourier transform infrared spectrometer

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2 Author(s)
Minato, Hideyuki ; AIST Kansai, Amagasaki Site, National Institute of Advanced Industrial Science and Technology (AIST), 3-11-46 Nakoji, Amagasaki, Hyogo 661-0974, Japan ; Ishido, Yoshinari

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An optical system was produced experimentally for infrared absorption measurements based on the photothermal deflection effect of solid material (KRS-5), which does not require a cell for the medium as does absorption measurement using the photothermal deflection effect of liquids. In this study, it was shown that the photoelastic effect of photothermal beam deflection exists in KRS-5 crystals, and the necessity of regulating the polarization direction of the laser beam is described. Infrared absorption spectral measurements were done on several samples using a stepped-scan Fourier transform infrared spectrometer for the evaluation of this technique. The results agreed well with the results of transmittance measurements of the same samples. In conclusion, this new technique seems to be useful for the measurement of infrared absorption. © 2001 American Institute of Physics.

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Review of Scientific Instruments  (Volume:72 ,  Issue: 7 )