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High resolution nonlinear microscopy: A review of sources and methods for achieving optimal imaging

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2 Author(s)
Squier, J. ; Electrical and Computer Engineering, University of California, San Diego, Urey Hall Addition, MC 0339, 9500 Gilman Drive, La Jolla, California 92093-0339 ; Muller, M.

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This article reviews the latest instrumentation used in high resolution nonlinear microscopy and techniques for the temporal and spatial calibration of this instrumentation. This includes an overview of currently available ultrashort laser sources, the dispersion characteristics of microscopes, methods for pulse measurement at high numerical aperture, dispersion compensation techniques, and finally a brief overview of a number of nonlinear imaging methods presently used in these systems. © 2001 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:72 ,  Issue: 7 )