Skip to Main Content
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1304864
A magneto-optic Kerr effect polarimeter designed to study the dynamics of magnetization reversal in ultrathin films, multilayer films, and microstructures is described. The polarimeter is integrated into a long focal-length charge coupled device (CCD) camera based Kerr microscope that permits viewing domain structures and facilitates positioning of the focused polarimeter beam on microstructures in ultrahigh vacuum. Diffraction-limited spatial resolution, based on the f-number of the respective objective lenses, is achieved by the microscope (∼1 μm) and polarimeter (∼5 μm). The polarimeter is capable of measuring continuous wave or repetitive transient ultrathin film magnetic response at sampling rates of 40 million samples/s (MS/s) over a micron-scale region defined by the illuminating spot. Hysteresis loops generated by ultrathin (monolayer) films and microstructures can be measured at high signal-to-noise ratio over a nine-decade range of drive frequencies. © 2000 American Institute of Physics.