By Topic

High-speed high spatial resolution magneto-optic Kerr effect polarimeter/microscope for studies of ultrathin magnetic structures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Heidkamp, Marcus ; Physics Department, The University of Texas at Austin, Austin, Texas 78712 ; Erskine, J.L.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1304864 

A magneto-optic Kerr effect polarimeter designed to study the dynamics of magnetization reversal in ultrathin films, multilayer films, and microstructures is described. The polarimeter is integrated into a long focal-length charge coupled device (CCD) camera based Kerr microscope that permits viewing domain structures and facilitates positioning of the focused polarimeter beam on microstructures in ultrahigh vacuum. Diffraction-limited spatial resolution, based on the f-number of the respective objective lenses, is achieved by the microscope (∼1 μm) and polarimeter (∼5 μm). The polarimeter is capable of measuring continuous wave or repetitive transient ultrathin film magnetic response at sampling rates of 40 million samples/s (MS/s) over a micron-scale region defined by the illuminating spot. Hysteresis loops generated by ultrathin (monolayer) films and microstructures can be measured at high signal-to-noise ratio over a nine-decade range of drive frequencies. © 2000 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:71 ,  Issue: 8 )