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Multiple-reflection interferometer for high accuracy measurement of small vibration displacement

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2 Author(s)
Lee, Doo Hee ; Acoustics and Vibration Laboratory, Korea Research Institute of Standard and Science, Yusong, Taejon 305-600, Korea ; Byoung Yoon Kim

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1150565 

A novel multiple-reflection interferometer is developed for the accurate measurement of sinusoidal vibration amplitudes, and its characteristics are analyzed theoretically and experimentally. The multiple-reflection system employs a right-angle prism and a convex lens, which is located in the probe beam path of a Michelson interferometer. The performance of the multiple reflection interferometer as a function of reflection number was assessed at the vibration frequency of 1250 Hz using Bessel function null method. © 2000 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:71 ,  Issue: 5 )

Date of Publication:

May 2000

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