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Quantitative measurements of the chemical composition of unprepared samples, using a reflectron mass analyzer with a microchannelplate detector assembly

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8 Author(s)
Mroz, W. ; Institute of Optoelectronics, MUT, 01-489 Warsaw 49, Poland ; Prokopiuk, A. ; Kozlov, B. ; Czujko, T.
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This article presents measurements of the chemical composition of Al–Li samples using a reflectron mass analyzer and laser ionization of the sample. The measurements were taken of as-received samples with rough surfaces to ascertain if useful results could be obtained from samples that had not been cleaned or prepared in any way. The power density of the laser used (Nd:yttrium–aluminum–garnet λ=1.06 μm, E≅6 mJ, τ=5 ns) was I∼3×109W/cm2. We have described the quantitative processing of our results using the measured analog particle gains of the Galileo microchannelplates. The problems associated with quantitative measurements of ion pulses using a microchannelplate detector assembly are also discussed. © 2000 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:71 ,  Issue: 3 )

Date of Publication:

Mar 2000

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