Cart (Loading....) | Create Account
Close category search window

Quantitative measurements of the chemical composition of unprepared samples, using a reflectron mass analyzer with a microchannelplate detector assembly

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Mroz, W. ; Institute of Optoelectronics, MUT, 01-489 Warsaw 49, Poland ; Prokopiuk, A. ; Kozlov, B. ; Czujko, T.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

This article presents measurements of the chemical composition of Al–Li samples using a reflectron mass analyzer and laser ionization of the sample. The measurements were taken of as-received samples with rough surfaces to ascertain if useful results could be obtained from samples that had not been cleaned or prepared in any way. The power density of the laser used (Nd:yttrium–aluminum–garnet λ=1.06 μm, E≅6 mJ, τ=5 ns) was I∼3×109W/cm2. We have described the quantitative processing of our results using the measured analog particle gains of the Galileo microchannelplates. The problems associated with quantitative measurements of ion pulses using a microchannelplate detector assembly are also discussed. © 2000 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:71 ,  Issue: 3 )

Date of Publication:

Mar 2000

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.