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Measurement of the complex dielectric constant down to helium temperatures. II. Quasioptical technique from 0.03 to 1 THz

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4 Author(s)
Reedijk, J.A. ; Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands ; Martens, H.C.F. ; Smits, B.J.G. ; Brom, H.B.

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A quasioptical method is described that allows the determination of the complex dielectric constant almost continuously in the millimeter wave regime without the use of electrical contacts. The technique allows the dielectric properties of bulk samples (solids, powders, and liquids) and thin films (free standing or deposited on a substrate) to be measured with excellent absolute accuracy down to 2 K. © 2000 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:71 ,  Issue: 2 )

Date of Publication:

Feb 2000

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