Cart (Loading....) | Create Account
Close category search window

Measurement of the complex dielectric constant down to helium temperatures. I. Reflection method from 1 MHz to 20 GHz using an open ended coaxial line

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Martens, H.C.F. ; Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands ; Reedijk, J.A. ; Brom, H.B.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The reflection off an open ended coaxial probe pressed against a material under test is used to determine the complex microwave (1 MHz–20 GHz) dielectric response of the material. A full-wave analysis of the aperture admittance of the probe, in terms of the dielectric properties of the backing material and the dimensions of the experimental geometry, is given. We discuss the calibration procedure of the setup and present the complex dielectric response of several materials determined from the measured reflection coefficient. The results obtained with the open ended coax interpolate well between data taken at lower and higher frequency bands using different experimental methods. We demonstrate that this method can be applied to perform dielectric measurements at cryogenic temperatures. © 2000 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:71 ,  Issue: 2 )

Date of Publication:

Feb 2000

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.