Close category search window
 

Calibration of piezoelectric bimorphs for experiments in a surface forces apparatus

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bae, Sung Chul ; Departments of Materials Science, Chemical Engineering and Chemistry, University of Illinois, Urbana, Illinois 61801 ; Granick, Steve

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1288233 

A simple interferometric method is described to measure the time-dependent deformation of piezoelectric bimorphs driven by ac voltage. Applying this method to a bimorph assembly used to measure viscoelastic forces in a surface forces apparatus, we find that a sinusoidal-shaped harmonic drive voltage generates sinusoidal deformation but that a triangular-shaped harmonic drive voltage fails to produce triangular-shaped deformation if the drive frequency exceeds 1/100 of the resonance frequency. Sinusoidal displacement amplitudes as small as 0.1 nm were resolved. © 2000 American Institute of Physics.

Published in:
Review of Scientific Instruments  (Volume:71 ,  Issue: 10 )

Date of Publication: Oct 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.