By Topic

A method for measuring low capacitance for tomography

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Fuqun Shao ; School of Information Science and Technology, Northeastern University, Shenyang 110006, People’s Republic of China ; Mong, QinGuo

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1149883 

The applications of electrical capacitance tomography (ECT) to image multiphase flows in pipelines, fluidization process, interfaces in separation vessels, and combustion phenomena in internal combustion engines have been studied for some years. In these applications, none of the equipment imaged has an inner diameter exceeding 1 m. When ECT techniques for large industrial equipment like blast furnaces are explored, the existing methods for measuring low capacitance have some limitations. This article proposes a method for measuring low capacitance which is suitable to construct ECT systems for imaging large industrial equipment. The method is based on single high-voltage excitation and magnetic C/V converting principle which can resist interference by stray capacitance. Experiment results indicated that the method has good performance in regard to resolution, linearity, and stability. Though the method was designed for imaging large equipment, it can also be applicable to other fields where low capacitance measurements are required. © 1999 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:70 ,  Issue: 7 )