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Low temperature ultrahigh vacuum cross-sectional scanning tunneling microscope for luminescence measurements

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4 Author(s)
Khang, Yoonho ; Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 ; Park, Yeonjoon ; Salmeron, Miquel ; Weber, Eicke R.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1150118 

We have constructed a scanning tunneling microscope with simultaneous light collection capabilities in order to investigate the opto-electronic properties of semiconductors. The microscope has in situ sample cleavage mechanism for cross-sectional sample. In order to reach low temperature (4 K), we used a specially designed cryostat. The efficiency of light collection generated in the tip-surface junction was greatly improved by use of a small parabolic mirror with the tip located at its focal point. © 1999 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:70 ,  Issue: 12 )

Date of Publication:

Dec 1999

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