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We have directly measured the resistivity weighting function—the sensitivity of a four-wire resistance measurement to local variations in resistivity—for a square specimen of photoconducting material. This was achieved by optically perturbing the local resistivity of the specimen while measuring the effect of this perturbation on its four-wire resistance. The weighting function we measure for a square geometry with electrical leads at its corners agrees well with calculated results, displaying two symmetric regions of negative weighting which disappear when van der Pauw averaging is performed.© 1998 American Institute of Physics.