Cart (Loading....) | Create Account
Close category search window

Automatic system for the direct and continuous measurement of the irreversibility line of high Tc superconductors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Flores, L.E. ; Superconductivity Laboratory, IMRE, University of Havana, Zapata y G, S/N, Ciudad de la Habana 10400, Cuba ; Noda, C. ; Abascal, C. ; Gonzalez, J.L.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A system for the direct and continuous determination of the irreversibility line in high Tc superconductors is described. The system, based on a standard ac susceptometer, operates by applying a controlled dc field to the sample that maximizes the imaginary (out-of-phase) component of the ac susceptibility. This control is achieved using a proportional-integral-derivative loop with the reference set to zero and with the magnetic field derivative of the imaginary component of the ac susceptibility taken as the feedback sample (error signal). To obtain a dc voltage proportional to this derivative a double lock-in detection scheme is used. This apparatus is able to carry out a continuous measurement of this line by sweeping the temperature in the range of interest while the sample is maintained, by the controller, at the irreversibility magnetic field at each temperature. Hence, the whole process is accomplished in the same time as a typical resistivity-versus-temperature measurement, which is faster than other methods. © 1998 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:69 ,  Issue: 10 )

Date of Publication:

Oct 1998

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.