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Measurement of sensitivity distributions of capacitance tomography sensors

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2 Author(s)
Yang, W.Q. ; Department of Electrical Engineering and Electronics, Process Tomography Group, University of Manchester Institute of Science and Technology (UMIST), P.O. Box 88, Manchester M60 1QD, United Kingdom ; Conway, W.F.

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Currently most electrical capacitance tomography systems employ the linear back-projection algorithm to reconstruct cross sectional images, the processing of which requires sensitivity maps for all electrode pairs. Usually these sensitivity maps are obtained by finite element analysis with accuracy limited by available data on sensor geometry. Alternatively they can be more accurately obtained by physical measurements so that the imaging accuracy can be improved. A test rig has been built at UMIST for this purpose. It can be controlled manually or by a computer. The experimental result shows the feasibility. © 1998 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:69 ,  Issue: 1 )