By Topic

Silicon-based surface plasmon resonance combined with surface-enhanced Raman scattering for chemical sensing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Nikitin, P.I. ; General Physics Institute of the Russian Academy of Sciences, 38 Vavilov Street, 117942 Moscow, Russia, CIS ; Beloglazov, A.A. ; Valeiko, M.V. ; Creighton, J.A.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1148160 

A Si-based surface plasmon resonance (SPR) technique has been successfully applied to NO2 sensing at ppm level, with estimated detectability at less than 100 ppb. Surface-enhanced Raman scattering (SERS) has been used in this scheme as an inherent additional data acquisition channel capable of providing spectroscopic selectivity and amplified sensitivity. The behavior of both the SERS spectrum and the SPR-induced photosignal produced by Au-on-Si grating structures coated with thin 18-crown-6 metal-free phthalocyanine films was simultaneously recorded for exposure of the films to 10 ppm of NO2 in air and its reversal in clean air. Both responses have been found to be reversible. The combination of Si-based SPR and SERS looks promising for thin-film and surface explorations, both in fundamental and sensor applications. © 1997 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:68 ,  Issue: 6 )