By Topic

Pulsed thrust measurements using laser interferometry

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Cubbin, E.A. ; Electric Propulsion and Plasma Dynamics Laboratory, Princeton University, Princeton, New Jersey 08544 ; Ziemer, J.K. ; Choueiri, E.Y. ; Jahn, R.G.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

An optical interferometric proximeter system (IPS) for measuring thrust and impulse bit of pulsed electric thrusters was developed. Unlike existing thrust stands, the IPS-based thrust stand offers the advantage of a single system that can yield electromagnetic interference-free, high accuracy (≪2% error) thrust measurements within a very wide range of impulses (100 μN s to above 10 N s) covering the impulse range of all known pulsed plasma thrusters. In addition to pulsed thrusters, the IPS is theoretically shown to be capable of measuring steady-state thrust values as low as 20 μN for microthrusters such as the field emission electric propulsion thruster. The IPS-based thrust stand relies on measuring the dynamic response of a swinging arm using a two-sensor laser interferometer with 10 nm position accuracy. The wide application of the thrust stand is demonstrated with thrust measurements of an ablative pulsed plasma thruster and a quasi-steady magnetoplasmadynamic thruster. © 1997 American Institute of Physics.  

Published in:

Review of Scientific Instruments  (Volume:68 ,  Issue: 6 )