Cart (Loading....) | Create Account
Close category search window
 

An ultrahigh vacuum surface analysis instrument incorporating a Fourier transform mass spectrometer and a Fourier transform infrared spectrometer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Abdelrehim, Ihab M. ; Contribution from the Department of Chemistry, University of California, Davis, California 95616 ; Thornburg, Nick A. ; Land, Donald P.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1148434 

An ultrahigh vacuum chamber equipped with Fourier transform reflection absorption infrared spectroscopy, Fourier transform mass spectrometry, laser-induced thermal desorption, Auger electron spectroscopy, and low energy electron diffraction is described. The marriage of the various techniques has led to novel designs for sample manipulation and incorporation of the instrumentation. A new ion deflection technique is also described. Some results from studies of hydrocarbon reactions on Pd(111) surfaces, such as desorption kinetics for propene and the kinetics and mechanisms of acetylene cyclization to benzene and thiophene, are discussed, as are analyses of oxidized Ti foils exposed to the ambient environment. The performance of this instrument is thus evaluated. © 1997 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:68 ,  Issue: 12 )

Date of Publication:

Dec 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.