By Topic

Shear-force detection based on an external cavity laser interferometer for a compact scanning near field optical microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Pfeffer, M. ; Institut d’Optique Appliquée, Ecole polytechnique fédérale, 1015 Lausanne, Switzerland ; Lambelet, P. ; Marquis-Weible, F.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1148450 

A compact near field optical microscope module is presented, with shear-force detection based on an external cavity laser interferometer. Its Al2O3 structure allows minimal sensitivity towards thermal and mechanical perturbations. Together with a precise and easy-to-handle tip fixation system, involving standard commercially available elements, this module is simple to use, and allows to detect a minimum displacement of 5.9 pmrms/

 Hz
,
with a large working distance of 10.5 mm. © 1997 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:68 ,  Issue: 12 )