Cart (Loading....) | Create Account
Close category search window
 

Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rabe, U. ; Fraunhofer Institute for Nondestructive Testing (IzfP), University, D‐66123 Saarbruecken, Germany ; Janser, K. ; Arnold, W.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1147409 

With an optical interferometer, the free vibration spectra and the local vibration amplitude of four rectangular atomic force microscope cantilevers made of silicon have been examined experimentally in a spectral range of 100 kHz to 10 MHz. A good agreement with the flexural wave theory of elastic beams was found. Coupling to torsional vibrations was also observed. When the sensor tip of the cantilever is in contact with a sample surface the resonances are shifted in frequency and the vibration amplitudes along the cantilever change. A method is presented to calculate this frequency shift using a linear approximation for the tip–sample interaction forces, and the results are compared with the frequency shift calculated from the point‐mass model. The measured resonance frequencies of a surface‐coupled cantilever do not correspond as well to the theoretical ones as in the free case even if the elastic‐beam model is used. The reason for the disagreement is found to be the geometry of the commercial cantilevers and the nonlinearity of the tip‐sample interaction force. © 1996 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:67 ,  Issue: 9 )

Date of Publication:

Sep 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.