Cart (Loading....) | Create Account
Close category search window
 

A scanning near‐field optical microscope for the imaging of magnetic domains in reflection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Silva, T.J. ; Center for Magnetic Recording Research, University of California, San Diego, 9500 Gilman Drive, La Jolla, California 92093‐0401 ; Schultz, S.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1146658 

The design and implementation of a scanning near‐field optical microscope expressly intended for the imaging of magnetic domains in reflection with subwavelength resolution is described. The microscope employs ∼40 nm silver particles optically excited at the plasmon resonance as the near‐field probes. Special attention is given to the Newton ring interferometer used to regulate the separation between the near‐field probe and the sample. The results of two tests of the microscope performance are presented. The first is a measurement of the dependence of the near‐field magneto‐optic Kerr effect on probe/sample spacing for a longitudinally magnetized metallic thin film. The effect decreases rapidly with increasing separation with a length scale comparable to the probe size. The second is a series of images of a domain in a perpendicularly magnetized multilayer metallic film at different probe/sample spacings. The images indicate a persistent effect with increasing separation but diminishing resolution. Fundamental differences between the near‐field magneto‐optic Kerr effect for perpendicularly and longitudinally magnetized samples is discussed. An estimate is made as to the fundamental limit of resolution with this particular form of near‐field microscopy. © 1996 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:67 ,  Issue: 3 )

Date of Publication:

Mar 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.