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The rate limitation of a photon counting germanium solid‐state detector system is largely determined by the shaping time of the amplifier, which is in turn set by the required system resolution. This rate limitation arises because when an event passes into the shaping amplifier, it is paralyzed for a time referred to as the dead time, which is a function of the shaping time. If any further events pass into the shaping amplifier during this time, one or both events may be corrupted or lost. This phenomenon is known as pulse pileup. However, if one uses an incident count rate monitor (ICR) which gives an accurate indication of the incident photon rate but no energy information, one can correct for any pulses lost in the shaping amplifier due to pileup. This allows one to run the detector system at higher rates and still retain throughput linearity. This has been shown by the work of Zhang et al. The authors also showed that with respect to EXAFS, the loss of linearity due to pulse pileup at high rates has two main effects: (1) The EXAFS oscillations and edge step height are reduced and (2) noise and glitches present in I
Published in:
Review of Scientific Instruments
(Volume:66
,
Issue:
2
)
Date of Publication: Feb 1995