Cart (Loading....) | Create Account
Close category search window

Optical diagnostic to measure ion temperature and parallel velocity fluctuations on the Tokamak Fusion Test Reactor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Evensen, H.T. ; Department of Nuclear Engineering and Engineering Physics, University of Wisconsin‐Madison, Madison, Wisconsin 53706 ; Durst, R. ; Fonck, R.J. ; Paul, S.F.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A high‐throughput, high‐frequency charge exchange recombination spectroscopy diagnostic (HF‐CHERS) has been developed to give localized measurements of ion temperature and parallel velocity microturbulence (T~i,v~) in the plasma core of the Tokamak Fusion Test Reactor (TFTR). HF‐CHERS uses an interference filter spectrometer to measure intensity fluctuations simultaneously over several wavelength intervals of the line shape of the n=8–7 transition of C+5 (529 nm). T~i and v~ are deduced from the moments of the emitted line shape. Using the beam emission spectroscopy optics on TFTR, measurements are made with 1–2 μs time resolution and ≊2 cm spatial resolution. The initial implementation of the diagnostic is expected to be sensitive to temperature fluctuations of T~/T≥1%. © 1995 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:66 ,  Issue: 1 )

Date of Publication:

Jan 1995

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.