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Complex dielectric constant measurement of samples of various cross sections using a microwave impedance bridge

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2 Author(s)
Joo, J. ; Department of Physics, The Ohio State University, Columbus, Ohio 43210‐1106 ; Epstein, A.J.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1144665 

A microwave impedance bridge covering from 8.2 to 12.4 GHz used for measuring complex dielectric constants over a wide temperature range is described. This apparatus is suited for materials formed into solid posts having different cross sections. The effective diameters for use in the analysis of circular, elliptical, or rectangular cross‐section posts are presented. The effective diameters are applied to determine the complex dielectric constant of rectangular‐shaped conducting polymer film. The frequency and temperature dependence of the dielectric constant and conductivity are presented, and compared with those obtained using a microwave cavity perturbation technique at 6.5 GHz. The bridge results are well suited for independent determination of the depolarization factor of a rectangular post for use in analysis of results of the cavity perturbation method.

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Review of Scientific Instruments  (Volume:65 ,  Issue: 8 )