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A new x‐ray diffraction method is described for measuring radii of curvature of crystals using a one‐dimensional solid‐state detector together with an extremely parallel incident x‐ray beam. The present method is based on the measurement of the slope of loci of rocking curve maximum in a contour map of x‐ray rocking curves versus position on the sample. The detection limit for the radius of curvature is estimated to be a few thousand meters using this method. The local variation of the curvature over a sample is easily revealed and precisely determined from the contour map of x‐ray rocking curves. Several examples of curvature determination by the present method are presented and compared with the results of the commonly used double‐crystal diffractometer method.