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We describe a simple method for improving the spectral resolution of soft x‐ray and extreme ultraviolet spectrographs which use electro‐optical detector/intensifiers. In this method, the spectrometer is focused onto a narrow slit which is angled near 90° with respect to the dispersive axis and placed just in front of the detector. Proper choice of the width and angle of the slit is shown to have the effect of expanding the spectrum along the length of the slit to the point where the spatial resolution limitations of the detector are overcome.