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EXAFS at grazing incidence: Data collection and analysis

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1 Author(s)
Heald, S.M. ; Brookhaven National Laboratory, Upton, New York 11973

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Extended x‐ray absorption fine structure (EXAFS) at grazing incidence can be applied to a large variety of surface and interface problems. This paper discusses in detail the collection and analysis of such data using interface EXAFS from metal/Al bilayers as an example. A comparison of the fluorescence and reflectivity detection channels is given, along with a discussion of the methods for correction of anomalous dispersion distortions. In addition, data from a Ni‐Ti multilayer is used to demonstrate the potential of enhancing the sensitivity of the EXAFS signal to selected regions using standing wave effects.

Published in:

Review of Scientific Instruments  (Volume:63 ,  Issue: 1 )