By Topic

EXAFS at grazing incidence: Data collection and analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
1 Author(s)
Heald, S.M. ; Brookhaven National Laboratory, Upton, New York 11973

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1142632 

Extended x‐ray absorption fine structure (EXAFS) at grazing incidence can be applied to a large variety of surface and interface problems. This paper discusses in detail the collection and analysis of such data using interface EXAFS from metal/Al bilayers as an example. A comparison of the fluorescence and reflectivity detection channels is given, along with a discussion of the methods for correction of anomalous dispersion distortions. In addition, data from a Ni‐Ti multilayer is used to demonstrate the potential of enhancing the sensitivity of the EXAFS signal to selected regions using standing wave effects.

Published in:

Review of Scientific Instruments  (Volume:63 ,  Issue: 1 )