By Topic

Soft x‐ray microscopy with coherent x rays (invited)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

10 Author(s)
Kirz, J. ; Physics Department, State University of New York at Stony Brook, Stony Brook, New York 11794 ; Ade, H. ; Jacobsen, C. ; Ko, C.‐H.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The Soft X‐ray Undulator beamline at the NSLS supports a soft x‐ray imaging program including scanning transmission microscopy, scanning photoemission microscopy, Gabor and Fourier transform holography, and large angle diffraction. Zone plates from an LBL Center for X‐ray Optics/IBM collaboration are used as optical elements. The current instrumentation of the beamline and the experimental stations is discussed, along with plans for the future at the NSLS and prospects for imaging programs at third generation sources.

Published in:

Review of Scientific Instruments  (Volume:63 ,  Issue: 1 )