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Thermal conductivity measurement from 30 to 750 K: the 3ω method

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1 Author(s)
Cahill, David G. ; Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853‐2501

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1141498 

An ac technique for measuring the thermal conductivity of dielectric solids between 30 and 750 K is described. This technique, the 3ω method, can be applied to bulk amorphous solids and crystals as well as amorphous films tens of microns thick. Errors from black‐body radiation are calculated to be less than 2% even at 1000 K. Data for a‐SiO2, Pyrex 7740, and Pyroceram 9606 are compared to results obtained by conventional techniques.

Published in:

Review of Scientific Instruments  (Volume:61 ,  Issue: 2 )

Date of Publication:

Feb 1990

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