Cart (Loading....) | Create Account
Close category search window

Conceptual design and numerical simulation of a correlation diagnostic for measurement of magnetic fluctuations in plasmas

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Thomas, C.E. ; Nuclear Engineering Program, Georgia Institute of Technology, Atlanta, Georgia 30332 ; Hanson, G.R. ; Gandy, R.F. ; Batchelor, D.B.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

It has been previously suggested that crossed‐sightline correlation of electron cylotron emission might be used to measure magnetic fluctuations in high‐temperature plasmas. Reported here are the results of a continuing project to determine under what conditions (if any) this measurement will be feasible. An initial conceptual design for the device hardware has been completed. Large portions of the numerical simulation are working, including ray‐tracing and emission/absorption packages. An initial discussion of data analysis for the experimental data is presented, and an analysis of the uncertainty in the line center (magnetic field) measurement in terms of the experimental uncertainties is given.

Published in:

Review of Scientific Instruments  (Volume:59 ,  Issue: 9 )

Date of Publication:

Sep 1988

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.