Cart (Loading....) | Create Account
Close category search window
 

Computer control and data‐acquisition system for the rf test facility

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Stewart, K.A. ; Oak Ridge National Laboratory, P. O. Box Y, Oak Ridge, Tennessee 37831 ; Burris, R.D. ; Mankin, J.B. ; Thompson, D.H.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1138790 

The radio frequency test facility (RFTF) at Oak Ridge National Laboratory, used to test and evaluate high‐power ion cyclotron resonance heating (ICRH) systems and components, is monitored and controlled by a multicomponent computer system. This data‐acquisition and control system consists of three major hardware elements: (1) an Allen‐Bradley PLC‐3 programmable controller, (2) a VAX 11/780 computer, and (3) a CAMAC serial highway interface. Operating in LOCAL as well as REMOTE mode, the programmable logic controller (PLC) performs all the control functions of the test facility. The VAX computer acts as the operator’s interface to the test facility by providing color mimic panel displays and allowing input via a trackball device. The VAX also provides archiving of trend data acquired by the PLC. Communications between the PLC and the VAX are via the CAMAC serial highway. Details of the hardware, software, and the operation of the system are presented in this paper.

Published in:

Review of Scientific Instruments  (Volume:57 ,  Issue: 8 )

Date of Publication:

Aug 1986

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.