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Manual/automated I–V system for analyzing solar cells

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3 Author(s)
Turner, R.D. ; Guelph‐Waterloo Program for Graduate Work in Physics, Waterloo Campus, University of Waterloo, Waterloo, Ontario, Canada N2L 3G1 ; Moore, C.J.L. ; Brodie, D.E.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1137662 

A measurement system for the current–voltage characterization of solar cells has been developed. The instrument is based on an Intel 8088 microprocessor, which allows for enhanced data collection and storage, as well as automated measurement control. A high‐power analog supply makes measurements in the range of -10 to +10 V and -0.75 to 0.75 A possible, and provides the capability for sinking currents up to 1 A at +10‐V output. Measured data may be transferred to an IBM personal computer for immediate display, and for consequent analysis (to obtain the characteristic parameters). The system provides a rapid, effective I–V curve measurement and analysis method for many devices, and experimental solar cells in particular.

Published in:

Review of Scientific Instruments  (Volume:55 ,  Issue: 11 )

Date of Publication:

Nov 1984

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