Cart (Loading....) | Create Account
Close category search window

Characterization of grain boundaries in polycrystalline solar cells using a computerized electron beam induced current system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Donolato, C. ; CNR‐Istituto Lamel, Via Castagnoli, 1, 40126 Bologna, Italy ; Bell, R.O.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The automatic evaluation of grain boundary activity in a polycrystalline solar cell can be carried out by interfacing a microcomputer to a scanning electron microscope operating in the electron beam induced current mode (EBIC). The grain boundary surface recombination velocity and diffusion length in the neighboring grains are obtained by digital acquisition and processing of the related EBIC profile. The technique is applied to the evaluation of hydrogen passivation of a ribbon solar cell.

Published in:

Review of Scientific Instruments  (Volume:54 ,  Issue: 8 )

Date of Publication:

Aug 1983

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.