Cart (Loading....) | Create Account
Close category search window

Minicomputer‐based test system for analyzing the electronic components of a large scale scientific research instrument

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Pecina, R.J. ; Electronics Division, Argonne National Laboratory, Argonne, Illinois 60439 ; Travis, D.J. ; Guercio, J.S. ; Hedtke, P.A.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Large scale research experiments often require the use of highly specialized and sophisticated electronic equipment including computer‐based data acquisition systems capable of gathering large amounts of data over very short time intervals. Equipment malfunctions can mean a loss of experimental data integrity and valuable research time. A diagnostic test system has been developed to monitor the electronic equipment of such an experiment, the Fast Neutron Hodoscope at the Transient Reactor Test Facility in Idaho. The system allows hodoscope electronics designers at Argonne National Laboratory in Illinois, and hodoscope maintenance engineers in Idaho, to observe simultaneously digital and analog signals from the hodoscope electronics while the hodoscope is in operation. The diagnostic test system can be controlled either locally by the engineers at the research site in Idaho or remotely by the designers in Illinois via a computer to computer telephone link between the two sites. As a result potential equipment problems as well as actual failures can often be pinpointed and corrected with minimal lost time and cost to the research program.

Published in:

Review of Scientific Instruments  (Volume:52 ,  Issue: 6 )

Date of Publication:

Jun 1981

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.