Close category search window
 

A quality metric for multi-objective optimization based on Hierarchical Clustering Techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Guimaraes, F.G. ; Dept. of Comput. Sci., Univ. Fed. de Ouro Preto, Ouro Preto ; Wanner, E.F. ; Takahashi, R.H.C.

This paper presents the hierarchical cluster counting (HCC), a new quality metric for nondominated sets generated by multi-objective optimizers that is based on hierarchical clustering techniques. In the computation of the HCC, the samples in the estimate set are sequentially grouped into clusters. The nearest clusters in a given iteration are joined together until all the data is grouped in only one class. The distances of fusion used at each iteration of the hierarchical agglomerative clustering process are integrated into one value, which is the value of the HCC for that estimate set. The examples show that the HCC metric is able to evaluate both the extension and uniformity of the samples in the estimate set, making it suitable as a unary diversity metric for multiobjective optimization.

Published in:
Evolutionary Computation, 2009. CEC '09. IEEE Congress on

Date of Conference: 18-21 May 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.