Fabrication of Multilayered ${\rm MgB}_{2}/{\rm Ni}$ Thin Films and Their Flux Pinning Properties

We prepared the multilayered MgB
₂
/Ni thin films with the Ni layer spacings of 32, 23 and 16 nm. The MgB
₂
/Ni multilayer nanostructure was confirmed to be obtained from the scanning transmission electron microscope observation. The clear enhancement of
J

_c
was observed in the multilayered MgB
₂
/Ni thin film when the magnetic field was applied parallel to the film surface. Moreover, the peak position of
F

_p
-
B
curves shifted to higher magnetic field with decreasing the Ni layer spacing.