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Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts

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8 Author(s)
Maffeis, T.G.G. ; Multidisciplinary Nanotechnology Centre, Swansea University, Swansea SA2 8PP, United Kingdom ; Penny, M.W. ; Brown, M.R. ; Liew, K.W.
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The surface properties of ZnO nanobelts grown by chemical vapor deposition were investigated by tapping mode atomic force microscopy (AFM) and scanning tunneling microscopy (STM). AFM images showed a type 1 (high aspect ratio) nanobelt lying across a type 2 (low aspect ratio) nanobelt, bending at an angle of 20.9° without breaking. Step defects were also observed on the surface for the first time, with step edges running along the [-1-120] direction. These surface defects are also observed by STM while scanning tunneling spectroscopy measurements yield a band gap of 3.3 eV and near flatband conditions.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:26 ,  Issue: 4 )

Date of Publication:

Jul 2008

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