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Fabrication of suspended dielectric mirror structures via xenon difluoride etching of an amorphous germanium sacrificial layer

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4 Author(s)
Cole, Garrett D. ; Center for Micro- and Nanotechnologies, Lawrence Livermore National Laboratory, Livermore, California 94550 ; Behymer, Elaine ; Goddard, L.L. ; Bond, T.C.

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The authors present a simplified fabrication method for the creation of free-standing dielectric mirrors for use in monolithic wavelength tunable surface-normal photonic devices, including vertical-cavity surface emitting lasers. This process utilizes a nonplasma dry etching process, based on the noble gas halide, xenon difluoride (XeF2), to remove an inorganic sacrificial film comprised of low-temperature deposited amorphous germanium -Ge). By utilizing nonplasma dry etching of an inorganic film, this procedure circumvents the need for critical point drying and avoids the limitations imposed by polymer-based sacrificial layers. In this procedure the authors observe remarkably rapid lateral etching, with rates in excess of 150 μm/min for electron-beam evaporated α-Ge films. The viability of this novel surface micromachining process is demonstrated by presenting the static and dynamic mechanical characteristics of electrostatically actuated suspended dielectric Bragg reflectors.

Published in:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:26 ,  Issue: 2 )

Date of Publication: Mar 2008

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