Cart (Loading....) | Create Account
Close category search window

Finite element modelling of pulsed eddy currents for nondestructive testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Patel, U. ; Bath Univ., UK ; Rodger, D.

The pulsed eddy current technique is widely used to detect flaws in conducting plates. Time transient data from the system can be used to produce a frequency response which enables a user to detect the presence of defects. This paper is concerned with modeling this technique using 3D finite elements. Data from the time transient finite element model is used to produce a frequency response, this is compared to values from an experimental test rig. A method of analyzing the response signal in real time is also discussed. This allows a fast method of detecting and quantifying defects in conducting structures

Published in:

Magnetics, IEEE Transactions on  (Volume:32 ,  Issue: 3 )

Date of Publication:

May 1996

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.