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Mean field annealing (MFA) and optimal design of electromagnetic devices

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3 Author(s)
Liyun Rao ; Dept. of Electr. Eng., Hebei Univ. of Technol., Tianjin, China ; Weili Yan ; Renjie He

This paper presents an optimal design method by means of mean field annealing (MFA). The mean field theory (MFT) is introduced, and a certain MFA application extension based on Peierls inequality is explained in detail, the critical temperature that is important for classes of problem while applying MFA is discussed. With MFA, the optimal size design of electromagnetic device is carried out. The results are compared with two existing algorithms, the modified simulated annealing (MSA) and one-variable stochastic simulated annealing based MFA (S-MFA), in both operating cost and final quantities. To modify the final results to reach the global optimum, Hooke-Jeeves pattern search method is adopted. Favorable results show the effectiveness of the proposed scheme

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Magnetics, IEEE Transactions on  (Volume:32 ,  Issue: 3 )