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Investigation into the effects of aluminum cathode modification and ion-beam-induced damage in organic light-emitting devices

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7 Author(s)
Jeong, Soon Moon ; Department of Metallurgical Engineering, Yonsei University, Seoul 120-749, Korea ; Koo, Won Hoe ; Choi, Sang Hun ; Sung Jin Jo
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We report a fabrication of organic light-emitting diodes (OLEDs) based on soluble phenyl-substituted poly-p-phenylene-vinylene (Ph-PPVs) thin films with aluminum cathode prepared by ion-beam-assisted deposition (IBAD). The electrical properties of the aluminum cathode, prepared by IBAD, on Ph-PPV have been investigated and compared to those by thermal evaporation. Energetic particles of Al assisted by an Ar+ ion may damage the organic material generating undesirable leakage current even though a thin Al buffer layer is applied to avoid Ar+-ion-induced damages. Substantial improvements of passivation characteristics were observed in IBAD device because the dense Al cathode inhibits the permeation of H2O and O2 into Ph-PPV film through pinhole defects, and thus retards dark spot growth. These results may be deduced from the highly packed structure that has small contact resistance between Al and Ph-PPV in ion-beam-assisted aluminum devices.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:22 ,  Issue: 5 )