By Topic

Cantilever probes for spatio-temporal imaging of voltage pulses with an ultrafast scanning probe microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Oesterschulze, E. ; Institute of Technical Physics, University of Kassel, Heinrich-Plett Strasse 40, 34109 Kassel, Germany ; Heisig, S. ; Steffens, W.M.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.1330262 

We report on a novel cantilever probe for the investigation of ultrafast signals. High temporal resolution is achieved by integrating a photoconductive switch within a coplanar waveguide structure onto a low temperature GaAs coated GaAs cantilever. Experimental results and numerical calculations on the detection of picosecond electrical signals based on the optoelectronic technique of photoconductive sampling are presented. © 2001 American Vacuum Society.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:19 ,  Issue: 1 )