By Topic

Study of instability in the field electron emission from amorphous diamond films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Chen, J. ; Department of Physics, Zhongshan University, Guangzhou 510275, People’s Republic of China ; Deng, S.Z. ; Zhen, X.G. ; Xu, N.S.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.590624 

Details are given of an experimental study of the current–voltage characteristics and instability of the field electron emission from amorphous diamond films prepared using a magnetic field-filtered ion deposition technique. A switch-on phenomenon is observed, and two types of instability are found, i.e., fluctuation at low currents and an abrupt change in emission associated with local breakdown events at high currents. Finally, it is found that, in order to establish stable emission with a current density approaching 50 mA/cm2, it is necessary to undergo the switch-on and local breakdown processes. These phenomena are characterized, and the physical mechanisms responsible for them are proposed. © 1999 American Vacuum Society.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:17 ,  Issue: 2 )