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Total uncertainty can be discussed in terms of bias and reproducibility. We have studied bias and reproducibility in the critical dimension measurement scanning electron microscope and measurements have derived expressions of them, and discussed the parameters which determine them by making a comparison with measurement data. © 1998 American Vacuum Society.
Published in:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
(Volume:16
,
Issue:
6
)
Date of Publication: Nov 1998
- Page(s):
- 3661 - 3667
- ISSN :
- 1071-1023
- Digital Object Identifier :
- 10.1116/1.590387
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 18 June 2009
- Issue Date :
- Nov 1998
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