Close category search window
 

Fabrication of high-temperature superconductor Josephson junctions by focused ion beam milling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Chen, C.‐H. ; Center for Superconductivity Research, University of Maryland, College Park, Maryland 20742 ; Trajanovic, Z. ; Dong, Z.W. ; Lobb, C.J.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.589651 

We have fabricated high-critical-temperature Josephson junctions using a focused ion beam (FIB) milling to define the gap, in a-axis oriented YBa2Cu3O7 (YBCO) films. A good quality normal metal/YBCO interface is obtained by in situ Au deposition. The effect of FIB milling has been studied with different milling conditions and the resulting devices exhibit different I–V characteristics, i.e., flux flow or superconductor/normal/superconductor Josephson junction behavior. The junctions exhibit Shapiro steps in their I–V characteristics under microwave irradiation. The critical current and normal resistance product (IcRn) of the order of 1 mV has been obtained. We also show that there is a voltage modulation in the superconducting quantum interference devices as a function of an applied magnetic flux up to 80 K. © 1997 American Vacuum Society.

Published in:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:15 ,  Issue: 6 )

Date of Publication: Nov 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.