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We developed an atomic force microscopy with the tip position was accurately controlled through the magnetic interaction between a coil and the magnet fixed behind the cantilever. By incorporating a feedback system, we could control the motion of a soft cantilever (0.68 N/m) in air and liquid, and obtain force curves without instabilities originating from the strong attractive and adhesive forces between the tip and the sample. © 1997 American Vacuum Society.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures (Volume:15 , Issue: 5 )
Date of Publication: Sep 1997