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Analysis of frictional-force image patterns of a graphite surface

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6 Author(s)
Sasaki, Naruo ; Department of Physics, Graduate School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan ; Tsukada, Masaru ; Fujisawa, Satoru ; Sugawara, Yasuhiro
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We discuss the mechanism of image patterns of the frictional-force microscopy (FFM) of a graphite surface by using a three-dimensional model comprised of a tip connected to a cantilever and a substrate surface. A simulated FFM image is in good agreement with an experimental one. A stable domain of the tip atom position can be defined in an analytic way. In the frictional-force regime, more than one quasistable tip atom position are mapped into a single cantilever basal position. Part of the boundary of the two-dimensional domain of the cantilever basal position appears as a fringe between the bright and the dark areas along the scan direction of the FFM image. General features of FFM images can be completely understood by this analysis. © 1997 American Vacuum Society.  

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:15 ,  Issue: 4 )

Date of Publication:

Jul 1997

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