By Topic

Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Carpick, R.W. ; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720Department of Physics, University of California at Berkeley, Berkeley, California 94720 ; Agrait, N. ; Ogletree, D.F. ; Salmeron, M.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.589083 

We have studied the variation of frictional force with externally applied load for a Pt‐coated atomic force microscope tip in contact with the surface of mica cleaved in ultrahigh vacuum. At low loads, the frictional force varies with load in almost exact proportion to the area of contact as predicted by the Johnson–Kendall–Roberts (JKR) theory [K. L. Johnson, K. Kendall, and A. D. Roberts, Proc. R. Soc. London Ser. A 324, 301 (1971)] of elastic adhesive contacts. The friction‐load relation for a deliberately modified tip shape was proportional to an extended JKR model that predicts the area‐load relation for nonparabolic tips. The tip shape was determined experimentally with a tip imaging technique and was consistent with the predicted friction behavior. This demonstrates that the frictional force is proportional to the area of contact between the tip and sample. Using the JKR/extended JKR model, interfacial surface energies and shear strengths can be estimated. © 1996 American Vacuum Society

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:14 ,  Issue: 2 )