Cart (Loading....) | Create Account
Close category search window

An automated precision gas sensor characterization system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Zhenan Tang ; Dept. of Electron. Eng., Dalian Univ. of Technol., China ; Wong, D.T.W. ; Chan, Philip C.H. ; Sin, J.K.O.
more authors

The automated gas sensor characterization system is designed for precision characterization of integrated or discrete gas sensors. Gas metering and data acquisition are computer controlled. Calibration of the gas concentration is carried out through the use of a gas analyzer or gas chromatography (GC). The system has been used to characterize two types of commercial gas sensors. The transient response of the gas sensors is therefore measured when the system first reaches equilibrium and then heating current is applied to heat up the sensor from the chamber ambient temperature to the sensor operating temperature. Details of experimental results for static and dynamic characterization of various commercial gas sensors are presented

Published in:

Microelectronics and VLSI, 1995. TENCON '95., IEEE Region 10 International Conference on

Date of Conference:

6-10 Nov 1995

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.