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The authors developed a scanning tunneling spectroscopy system which enables the current imaging tunneling spectroscopy (CITS) to be measured under an ultrahigh vacuum environment. The scanning tunnel microscope and CITS of Bi–O surfaces of Bi
Published in:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
(Volume:10
,
Issue:
5
)
Date of Publication: Sep 1992