Cart (Loading....) | Create Account
Close category search window
 

Band‐gap engineering via graded gap, superlattice, and periodic doping structures: Applications to novel photodetectors and other devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Capasso, F. ; Bell Laboratories, Murray Hill, New Jersey 07974

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.582627 

Recent new multilayer structures and their device applications are reviewed. These new concepts allow one to radically modify the conventional energy band diagram of a pn junction and thus tailor the high field transport properties to an unprecedented degree (band‐gap engineering). This approach has been used to propose and implement a new class of avalanche photodiodes with enhanced ionization rates ratio and the solid state analog of a photomultiplier (staircase detector). Other device applications such as repeated velocity overshoot structures are also discussed.

Published in:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures  (Volume:1 ,  Issue: 2 )

Date of Publication:

Apr 1983

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.