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A Method on Analog Circuit Fault Diagnosis with Tolerance

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3 Author(s)
Yanjun Li ; Coll. of Autom., Univ. of Electron. Sci. & Technol. of China, Chengdu ; Houjun Wang ; Rueywen Liu

In this paper, it is proved that the direction of the node-voltage difference vector, which is the difference between the node-voltage vector at faulty state and the one at the nominal state, is determined only by the location of the faulty element in linear analog circuits. Considering that the direction of the node-voltage sensitivity vector is the same as the one of the node-voltage difference vector and also considering that the module of the node-voltage sensitivity vector can present the weight from the faulty element parameter deviation to the voltage difference, fault dictionary is made up of node-voltage sensitivity vectors. A decision algorithm is proposed concerned with both the location and the parameter difference of the faulty element. Single fault and multi-fault can be diagnosed while the circuit parameters deviate within the tolerance range of 10%.

Published in:

Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on

Date of Conference:

28-29 April 2009

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